High-precision atomic force microscopy with atomically-characterized tips
High-precision atomic force microscopy with atomically-characterized tips
复制标题
具有原子表征尖端的高精度原子力显微镜
DOI：
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发表时间：
2020
影响因子：
3.3
通讯作者：
F. Giessibl
中科院分区：
文献类型：
--
作者：
Alexander Liebig;Angelo Peronio;D. Meuer;A. J. Weymouth;F. Giessibl
Traditionally, atomic force microscopy (AFM) experiments are conducted at tip–sample distances where the tip strongly interacts with the surface. This increases the signal-to-noise ratio, but poses the problem of relaxations in both tip and sample that hamper the theoretical description of experimental data. Here, we employ AFM at relatively large tip–sample distances where forces are only on the piconewton and subpiconewton scale to prevent tip and sample distortions. Acquiring data relatively far from the surface requires low noise measurements. We probed the CaF2(111) surface with an atomically-characterized metal tip and show that the experimental data can be reproduced with an electrostatic model. By experimentally characterizing the second layer of tip atoms, we were able to reproduce the data with 99.5% accuracy. Our work links the capabilities of non-invasive imaging at large tip–sample distances and controlling the tip apex at the atomic scale.
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影响因子：
56.9
作者：
Emmrich, Matthias;Huber, Ferdinand;Giessibl, Franz J.
通讯作者：
Giessibl, Franz J.
影响因子：
56.9
作者：
Weymouth, Alfred John;Hofmann, Thomas;Giessibl, Franz J.
通讯作者：
Giessibl, Franz J.
影响因子：
17.1
作者：
Welker, Joachim;Weymouth, Alfred John;Giessibl, Franz J.
通讯作者：
Giessibl, Franz J.
影响因子：
8.6
作者：
Pielmeier, Florian;Giessibl, Franz J.
通讯作者：
Giessibl, Franz J.