Observation of the Creation and Annihilation of Local Current Paths in HfO2 Thin Films on Pt by Ultrahigh-Vacuum Conductive Atomic Force Microscopy: Evidence of Oxygen Spill Over during the Forming Process
Observation of the Creation and Annihilation of Local Current Paths in HfO2 Thin Films on Pt by Ultrahigh-Vacuum Conductive Atomic Force Microscopy: Evidence of Oxygen Spill Over during the Forming Process
复制标题
用超高真空导电原子力显微镜观察 Pt 上 HfO2 薄膜局部电流路径的产生和湮灭：形成过程中氧气溢出的证据
DOI：
10.1143/jjap.48.060202
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发表时间：
2009
影响因子：
1.5
通讯作者：
K. Kyuno
中科院分区：
文献类型：
--
作者：
Naotaka Sasaki;K. Kita;A. Toriumi;K. Kyuno
通过超高真空导电原子力显微镜的直接观察，我们发现在Pt上的HfO2薄膜中的单个局部电流路径的可逆产生和湮灭。获得了电场作用下氧离子扩散的实验证据。
By direct observation using ultrahigh-vacuum conductive atomic force microscopy, we find the reversible creation and annihilation of individual local current paths in HfO2 thin films on Pt. Experimental evidence of oxygen ion diffusion due to an electric field is obtained.
影响因子：
4
作者：
Sawa, A;Fujii, T;Tokura, Y
通讯作者：
Tokura, Y