Atomic resolution noncontact atomic force and scanning tunneling microscopy of TiO2(110)-(1 x 1) and - (1 x 2): simultaneous imaging of surface structures and electronic states.
Atomic resolution noncontact atomic force and scanning tunneling microscopy of TiO2(110)-(1 x 1) and - (1 x 2): simultaneous imaging of surface structures and electronic states.
复制标题
DOI：
10.1103/physrevlett.86.4334
复制
发表时间：
2001-05
影响因子：
8.6
通讯作者：
M. Ashino;Y. Sugawara;S. Morita;M. Ishikawa
中科院分区：
文献类型：
--
作者：
M. Ashino;Y. Sugawara;S. Morita;M. Ishikawa
我们提出了同时成像的二氧化钛（110）-（1 × 1）和-（1 × 2）使用非接触式原子力显微镜（NC-AFM）和扫描隧道显微镜（STM）。表面形貌在NC-AFM反馈下成像，而表面电子态由STM成像。NC-AFM和STM的图像对比度在（1 × 1）和（1 × 2）中分别为反相和同相。最上面的氧原子和下面的Ti原子分别通过NC-AFM和STM成像。NC-AFM图像对比度在（1 × 2）中接近真实表面形貌，但在（1 × 1）中降低。
We present simultaneous imaging of TiO2(110)-(1 x 1) and - (1 x 2) using noncontact atomic force microscopy (NC-AFM) and scanning tunneling microscopy (STM). The surface topography was imaged under NC-AFM feedback, while the surface electronic states were imaged by STM. The image contrasts of NC-AFM and STM were antiphase in (1 x 1) and in phase in (1 x 2). The uppermost oxygen and Ti atoms underneath were, respectively, imaged by NC-AFM and STM. The NC-AFM image contrast was close to the true surface topography in (1 x 2), but reduced in (1 x 1).