Design Churn as Predictor of Vulnerabilities?
Design Churn as Predictor of Vulnerabilities?
复制标题
设计流失作为漏洞的预测？
DOI：
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发表时间：
2014
期刊：
影响因子：
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通讯作者：
W. Joosen
中科院分区：
文献类型：
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作者：
A. Hovsepyan;R. Scandariato;Maximilian Steff;W. Joosen
本文评估了一个度量套件，以预测脆弱的Java类的基础上有多少应用程序的设计随着时间的推移发生了变化。它把这个概念称为设计扰动，类似于代码扰动。基于对10个Android应用程序的验证，它表明几个设计流失指标实际上与漏洞显著相关。当用于构建预测模型时，这些指标的平均精确度为0.71，平均召回率为0.27。
This paper evaluates a metric suite to predict vulnerable Java classes based on how much the design of an application has changed over time. It refers to this concept as design churn in analogy with code churn. Based on a validation on 10 Android applications, it shows that several design churn metrics are in fact significantly associated with vulnerabilities. When used to build a prediction model, the metrics yield an average precision of 0.71 and an average recall of 0.27.