Minimizing Artifacts in Three-electrode Double Layer Capacitance Measurements Caused by Stray Capacitances
Minimizing Artifacts in Three-electrode Double Layer Capacitance Measurements Caused by Stray Capacitances
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DOI：
10.1016/j.electacta.2015.07.074
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发表时间：
2015-09-10
影响因子：
6.6
通讯作者：
Roling, B.
中科院分区：
文献类型：
--
作者：
Balabajew, M.;Roling, B.
本文分析了杂散电容对离子阻断电极三电极电化学阻抗测量的影响。该装置广泛用于双电层电容测量。分析是基于一个三端等效网络，并揭示了杂散电容导致不同类型的电容和电感的文物。我们表明，伪影的类型强烈依赖于（i）工作电极和反电极之间的参考电极的定位和（ii）工作电极的双层电容与杂散电容的比率。我们比较的理论结果与实验结果的工作电极在三个电化学电池的双层电容与不同的面积和位置的电极。在这项工作的基础上，我们给出了如何最大限度地减少和/或纠正双电层电容测量中的三电极伪影的建议。(C)2015爱思唯尔有限公司版权所有。
We analyze the influence of stray capacitances on three-electrode electrochemical impedance measurements with ion-blocking electrodes. This setup is widely used for double layer capacitance measurements. The analysis is based on a three-terminal equivalent network and reveals that stray capacitances lead to different types of capacitive and inductive artifacts. We show that the type of artifact depends strongly on (i) the positioning of the reference electrode between the working and the counter electrode and (ii) on ratio of the double layer capacitance of the working electrode to the stray capacitances. We compare the theoretical results to experimental results obtained for the double layer capacitance of the working electrode in three electrochemical cells with different areas and positions of the electrodes. On the basis of this work, we give advice on how to minimize and/or correct three-electrode artifacts in double layer capacitance measurements. (C) 2015 Elsevier Ltd. All rights reserved.