Advanced Transient Current Technique Systems
Advanced Transient Current Technique Systems
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DOI:
10.22323/1.227.0032
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发表时间:
2015-01
期刊:
影响因子:
--
通讯作者:
G. Kramberger
中科院分区:
文献类型:
--
作者:
G. Kramberger
The Transient Current Technique has been one of the principal tools for studying solid state particle detectors over the last two decades. The basic properties of the system, its components, and signal analysis will be reviewed and examples of its use shown. The Scanning-TCT systems which are based on position resolved carrier generation along the beam with precision of few microns will be presented together with ways of their application as well as a novel way of using Scanning-TCT by utilizing two-photon-absorption for precise three dimensional spatial localization of generated e-h pairs inside the detector.