Optical properties of d-doped ZnSe:Te grown by molecular beam epitaxy: The role of tellurium
Optical properties of d-doped ZnSe:Te grown by molecular beam epitaxy: The role of tellurium
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分子束外延生长的 d 掺杂 ZnSe:Te 的光学特性：碲的作用
DOI：
10.1103/physrevb.63.155205
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发表时间：
2001
影响因子：
3.7
通讯作者：
M. Tamargo
中科院分区：
文献类型：
--
作者：
I. Kuskovsky;C. Tian;G. Neumark;J. Spanier;I. Herman;W. Lin;S. Guo;M. Tamargo
我们利用光致发光（PL）、X射线和拉曼散射研究了{delta}掺杂的ZnSe：Te系统的光学性质。研究了两种不同类型的样品，（1）具有单个{delta}层和（2）具有由未掺杂层隔开的三个相邻{delta}层。所有这些样品都具有合理的结晶质量，并且具有通过X射线和拉曼散射确定的主体ZnSe晶格的对称性。在低Te浓度下，来自每个样品的PL与来自本体Zn-Se-Te溶液的PL非常相似。从单{delta}掺杂材料的PL显示发射相对接近的带边，我们归因于部分的Te{sub 2}集群（最近邻对）和部分的非最近邻对。该PL随存储时间而变化，由此我们得出结论，最近邻对比非最近邻对更稳定。三-{delta}-掺杂的材料还显示出更深的PL特征，在约2.48 eV处具有峰值，我们将其归因于Te{sub n{>=}3}团簇以及相应的非最近邻对。
We have studied the optical properties of the {delta}-doped ZnSe:Te system using photoluminescence (PL) and x-ray and Raman scattering. Two different types of sample were investigated, (1) with a single {delta} layer and (2) with three adjacent {delta} layers separated by undoped layers. All of these samples are of reasonable crystalline quality and have the symmetry of the host ZnSe lattice as determined by x-ray and Raman scattering. The PL from each sample is very similar to the PL from bulk Zn-Se-Te solutions at low Te concentrations. The PL from the single-{delta}-doped material shows emission relatively close to the band edge which we attribute partly to Te{sub 2} clusters (nearest-neighbor pairs) and partly to non-nearest pairs. This PL changes with storage time, from which we conclude that the nearest-neighbor pairs are more stable than non-nearest-neighbor pairs. The triple-{delta}-doped material also shows a deeper PL feature, with a peak at about 2.48 eV, which we attribute to Te{sub n{>=}3} clusters as well as to corresponding non-nearest-neighbors pairs.