Development of innovative embedding procedures for the analyses of paint cross sections in ATR FITR microscopy
Development of innovative embedding procedures for the analyses of paint cross sections in ATR FITR microscopy
复制标题
开发创新的嵌入程序，用于 ATR FITR 显微镜中油漆横截面的分析
DOI：
--
复制
发表时间：
2012
影响因子：
4.3
通讯作者：
R. Mazzeo
中科院分区：
文献类型：
--
作者：
S. Prati;G. Sciutto;E. Catelli;A. Ashashina;R. Mazzeo
我们报告了利用衰减全反射(ATR)傅里叶变换红外显微镜分析涂料横截面的创新包埋方法的发展。之所以选择这项技术，是因为它被广泛用于艺术样品中有机和无机成分的表征和空间定位。此外，在表面形态和污染存在方面，样品制备可能会严重影响该技术的性能。首先，我们评估了KBrR作为防止包埋合成介质污染的屏障的使用。通过这种方式，可以通过样品夹持器抛光样品横截面，从而允许对样品施加受控压力，从而提高表面横截面的重复性和质量。此外，利用Ar离子研磨对镶嵌在KBrR中的样品进行了抛光，在表面平整度和减少KBrR表面污染方面取得了非常有希望的结果。最后，由于氯化钠在吸湿性、成本和毒性方面的优势，建议使用氯化钠作为溴化钾的替代品。此外，嵌入在氯化钠中的横截面具有更高的硬度，这一特点使我们能够获得与ATR晶体更好的接触。
We report the development of innovative embedding procedures for the analysis of paint cross sections by attenuated total reflection (ATR) Fourier transform IR microscopy. This technique was chosen because it is widely employed for the characterization and spatial location of organic and inorganic components in artistic samples. Moreover, the performance of the technique may be critically affected by sample preparation in terms of surface morphology and the presence of contamination. First, we evaluated the use of KBr as a barrier to contamination by the embedding synthetic medium. In this way, the sample cross section can be polished by means of a sample holder, which allows a controlled pressure to be applied to the sample, thus improving the reproducibility and quality of the surface cross section. In addition, argon ion milling was used for the polishing of samples embedded in KBr, and provided very promising results in terms of surface planarity and reduction of superficial contamination by KBr. Finally, the use of NaCl as an alternative to KBr was proposed thanks to its advantages in terms of hygroscopicity, cost, and toxicity. In addition, cross sections embedded in NaCl were characterized by greater hardness, a feature that allowed us to obtain improved contact with the ATR crystal.