Unraveling Depth-Specific Ionic Conduction and Stiffness Behavior across Ionomer Thin Films and Bulk Membranes
Unraveling Depth-Specific Ionic Conduction and Stiffness Behavior across Ionomer Thin Films and Bulk Membranes
复制标题
DOI：
10.1021/acsmacrolett.1c00110
复制
发表时间：
2021-06-10
影响因子：
7.015
通讯作者：
Dishari, Shudipto K.
中科院分区：
文献类型：
--
作者：
Farzin, Seefat;Zamani, Ehsan;Dishari, Shudipto K.
亚微米厚聚合物薄膜的界面行为对电化学器件的性能起着决定性的作用。我们开发了一个强大的，每天访问，荧光共聚焦激光扫描显微镜（CLSM）为基础的策略，可以探测整个离聚物样品的迁移率，离子传导和其他属性的分布。当荧光光酸探针8-羟基芘-1，3，6-三磺酸三钠盐（HPTS）掺入到
Interfacial behavior of submicron thick polymer films critically controls the performance of electrochemical devices. We developed a robust, everyday-accessible, fluorescence confocal laser scanning microscopy (CLSM)-based strategy that can probe the distribution of mobility, ion conduction, and other properties across ionomer samples. When fluorescent photoacid probe 8-hydroxypyrene-1,3,6-trisulfonic acid trisodium salt (HPTS) was incorporated into