Adapting to adaptive testing
Adapting to adaptive testing
复制标题
适应适应性测试
DOI：
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发表时间：
2010
期刊：
影响因子：
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通讯作者：
Chris Portelli
中科院分区：
文献类型：
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作者：
E. Marinissen;A. Singh;Daniel Glotter;Marco Esposito;J. Carulli;A. Nahar;K. Butler;D. Appello;Chris Portelli
自适应测试是一系列旨在提高测试质量和/或降低测试应用成本的技术的总称。在自适应测试中，测试内容或合格/不合格限制不像在常规测试中那样是固定的，而是取决于当前或先前测试的芯片的其他测试结果。部分平均测试、离群值检测和邻域筛选只是自适应测试的几个例子。通过这个嵌入的教程，我们将向更广泛的约会受众介绍这个在测试社区中很热门的主题。
Adaptive testing is a generic term for a number of techniques which aim at improving the test quality and/or reducing the test application costs. In adaptive tests, the test content or pass/fail limits are not fixed as in conventional tests, but dependent on other test results of the currently or previously tested chips. Part-average testing, outlier detection, and neighborhood screening are just a few examples of adaptive testing. With this Embedded Tutorial, we are offering an introduction to this topic, which is hot in the test community, to the wider DATE audience.