Spontaneous polarization of neodymium-substituted Bi4Ti3O12 estimated from epitaxially grown thin films with in-plane c-axis orientations
Spontaneous polarization of neodymium-substituted Bi4Ti3O12 estimated from epitaxially grown thin films with in-plane c-axis orientations
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DOI：
10.1143/jjap.43.l309
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发表时间：
2004-02-15
期刊：
影响因子：
--
通讯作者：
Funakubo, H
中科院分区：
文献类型：
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作者：
Watanabe, T;Kojima, T;Funakubo, H
用金属有机化学气相沉积法在金红石结构的(101)和(001)RuO2衬底上生长了(100)/(010)和(110)取向的掺钕Bi4Ti3O12薄膜。X-射线衍射仪的测试结果表明，外延生长的薄膜具有面内c轴取向。(100)/(010)和(110)取向薄膜的剩余极化强度分别为31和34umC/cm(2)。根据X射线衍射法估算的(100)/(010)取向薄膜的(100)和(010)取向晶体的体积分数，估算出掺钕的Bi4Ti3O12沿a轴的自发极化为58MUC/cm(2)。
(100)/(010)- and (110)-oriented neodymium-substituted Bi4Ti3O12 films were grown by metalorganic chemical vapor deposition on (101) and (001)RuO2 layers with a rutile structure. Epitaxial growth of the films with an in-plane c-axis orientation was confirmed by several X-ray diffraction measurements. Large remanent polarizations of 31 and 34 muC/cm(2) were observed for the (100)/(010)- and (110)-oriented films, respectively. On the basis of the volume fractions of (100)- and (010)-oriented crystal estimated for the (100)/(010)-oriented film by X-ray diffraction, the spontaneous polarization of neodymium-substituted Bi4Ti3O12 along the a-axis was estimated to be 58 muC/cm(2) from both kinds of epitaxial films.