Ultimate Precision Bound of Quantum and Subwavelength Imaging
Ultimate Precision Bound of Quantum and Subwavelength Imaging
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DOI：
10.1103/physrevlett.117.190802
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发表时间：
2016-11-04
影响因子：
8.6
通讯作者：
Pirandola, Stefano
中科院分区：
文献类型：
--
作者：
Lupo, Cosmo;Pirandola, Stefano
我们确定了量子成像在近轴近似下提高远场、衍射限制、线性成像设备分辨率的最终潜力。首先，我们证明了估计两个点状源之间的分离的问题等价于估计两个有损玻色子信道的损耗参数，即，两个分束器的透射率。使用这种表示，我们建立了解决两个点状源在任意量子态的最终精度界，与两个热源的特定情况下的一个简单的公式。我们发现，根据标准的量子限制的精度范围与收集的光子数。然后，我们确定的源，其分离可以最佳估计，发现量子相关源（纠缠或不和谐）可以在亚瑞利尺度超分辨。我们的研究结果适用于各种成像设置，从天文观测到显微镜，利用量子检测以及源工程。
We determine the ultimate potential of quantum imaging for boosting the resolution of a far-field, diffraction-limited, linear imaging device within the paraxial approximation. First, we show that the problem of estimating the separation between two pointlike sources is equivalent to the estimation of the loss parameters of two lossy bosonic channels, i.e., the transmissivities of two beam splitters. Using this representation, we establish the ultimate precision bound for resolving two pointlike sources in an arbitrary quantum state, with a simple formula for the specific case of two thermal sources. We find that the precision bound scales with the number of collected photons according to the standard quantum limit. Then, we determine the sources whose separation can be estimated optimally, finding that quantum-correlated sources (entangled or discordant) can be superresolved at the sub-Rayleigh scale. Our results apply to a variety of imaging setups, from astronomical observation to microscopy, exploiting quantum detection as well as source engineering.