Instrumentation for glancing angle x‐ray absorption spectroscopy on the Synchrotron Radiation Source
Instrumentation for glancing angle x‐ray absorption spectroscopy on the Synchrotron Radiation Source
复制标题
同步辐射源上的掠射角 X 射线吸收光谱仪器
DOI：
10.1063/1.1140719
复制
发表时间：
1989
影响因子：
1.6
通讯作者：
R. Oldman
中科院分区：
文献类型：
--
作者：
S. Pizzini;K. Roberts;G. Greaves;N. Harris;P. R. Moore;E. Pantos;R. Oldman
介绍了一种在达雷斯伯里同步辐射光源上常规使用的掠射角X射线吸收光谱（XAS）和X射线反射率的多功能仪器。该设备可用于反射率和荧光模式下的XAS测量，以及角相关X射线反射率的定性研究。给出了用该仪器在铜薄膜氧化表面上获得的反射率和XAS数据。
A versatile instrument for glancing‐angle x‐ray absorption spectroscopy (XAS) and x‐ray reflectivity in routine use on the Daresbury Synchrotron Radiation Source is described. This facility can be used for XAS measurements in both reflectivity and fluorescence modes as well as for qualitative studies of angular dependent x‐ray reflectivity. Reflectivity and XAS data obtained with this instrument on the oxidized surfaces of Cu thin films are presented.