Study of minority carrier diffusion length in multicrystalline silicon solar cells using photoassisted Kelvin probe force microscopy
Study of minority carrier diffusion length in multicrystalline silicon solar cells using photoassisted Kelvin probe force microscopy
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DOI：
10.1063/1.3264081
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发表时间：
2009-11
影响因子：
4
通讯作者：
M. Takihara;Takuji Takahashi;T. Ujihara
中科院分区：
文献类型：
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作者：
M. Takihara;Takuji Takahashi;T. Ujihara
利用光辅助开尔文探针力显微镜对多晶硅太阳电池中的少数载流子扩散长度进行了评价，探讨了多晶硅材料晶粒和晶界对太阳电池性能的影响。我们观察到晶界附近的扩散长度减少，即使考虑横向扩散的影响，晶粒之间的扩散长度也存在差异。
We evaluated the minority carrier diffusion length in multicrystalline silicon solar cells by means of photoassisted Kelvin probe force microscopy to investigate the influence of the multicrystalline material grains and the grain boundaries on solar cell performance. We observed a reduction in the diffusion length in the vicinity of the grain boundary and differences in the diffusion lengths between grains even when considering the influence of lateral diffusion.