Statistical methods for delay fault coverage analysis

Statistical methods for delay fault coverage analysis
复制标题

延迟故障覆盖分析的统计方法

DOI:
10.1109/icvd.1995.512098
复制
发表时间:
1995
期刊:
Proceedings of the 8th International Conference on VLSI Design
影响因子:
--
通讯作者:
M. Bushnell
M. Bushnell
中科院分区:
--
文献类型:
--
作者:
Keerthi Heragu;V. Agrawal;M. Bushnell

文献摘要

被引文献

相似文献

我们已经开发了新的统计技术的延迟故障分析。真值模拟使用描述两个连续向量的信号状态的多值逻辑系统来执行。信号统计用于估计转移概率和可观测性。这些使我们能够估计检测概率和过渡故障的覆盖率。对于路径延迟故障,认识到可能的路径的总数可以是指数的电路大小,我们设计了一个隐式随机路径采样过程,以获得一个线性时间估计的覆盖范围为所有故障。我们进一步推导出一个最长路径定理,以估计覆盖率相对于最长路径通过主输入和一组选定的扇出分支。针对最长路径的最小集合估计覆盖,使得每个信号引线被包括在至少一个目标路径中,该目标路径的传播延迟不小于包含该引线的任何路径的延迟。故障覆盖率估计密切同意从延迟故障模拟,同时给出了显着的加速。
We have developed new statistical techniques for delay fault analysis. True value simulation is performed using a multi-value logic system describing signal states of two consecutive vectors. Signal statistics are used to estimate transition probabilities and observabilities. These allow us to estimate detection probabilities and the coverage for transition faults. For path delay faults, recognizing that the total number of possible paths can be exponential in circuit size, we devise an implicit random path sampling procedure to obtain a linear-time estimate of the coverage for all faults. We further derive a longest path theorem to estimate coverages with respect to longest paths through primary inputs and a selected set of fanout branches. Coverages are estimated for a minimal set of longest paths such that each signal lead is included in at least one target path whose propagation delay is no less than the delay of any path containing the lead. The fault coverage estimates closely agree with those obtained from delay fault simulation while giving a significant speedup.