Plasma-assisted molecular beam epitaxy of Al(Ga)N layers and quantum well structures for optically pumped mid-UV lasers on c-Al2O3
Plasma-assisted molecular beam epitaxy of Al(Ga)N layers and quantum well structures for optically pumped mid-UV lasers on c-Al2O3
复制标题
DOI:
10.1088/0268-1242/29/8/084008
复制
发表时间:
2014-08-01
影响因子:
1.9
通讯作者:
Jmerik, V. N.
中科院分区:
文献类型:
--
作者:
Ivanov, S. V.;Nechaev, D. V.;Jmerik, V. N.
This paper reports on novel approaches developed for plasma-assisted molecular beam epitaxy of Al-rich AlGaN epilayers and quantum well heterostructures on c-sapphire, which allowed us to fabricate low-threshold optically-pumped separate confinement heterostructure lasers emitting in the mid-UV spectral range (258-290 nm) with the threshold power density below 600 kW cm(-2). The optimum buffer structure has been developed which provides lowering the near-surface threading dislocation density down to 1.5 x 10(8) and 3 x 10(9) cm(-2) for screw and edge types, respectively, and improving the surface morphology (rms < 0.7 nm at the area of 3x3 mu m(-2)). It comprises the high-temperature (780 degrees C) migration enhanced epitaxy growth of a (30-70) nm thick AlN nucleation layer on c-Al2O3, followed by a 2 mu m thick AlN buffer grown under the metal-rich conditions in the Al-flux modulation mode and containing several (up to 6) ultra-thin (similar to 3 nm) GaN interlayers grown at N-rich conditions. Proper strain engineering in AlGaN single quantum well heterostructure grown atop of the AlN buffer layer enables one to preserve dominant TE polarization of both spontaneous and stimulated emission even at shortest obtained wavelength (258 nm). The threshold power density of stimulated emission as low as 150 kW cm(-2) at 289 nm for a single quantum well laser structure has been demonstrated.