Current-induced switching of thin film α−Fe2O3 devices imaged using a scanning single-spin microscope
Current-induced switching of thin film α−Fe2O3 devices imaged using a scanning single-spin microscope
复制标题
使用扫描单旋转显微镜成像的薄膜αFe2O3器件的电流感应开关
DOI:
10.1103/physrevmaterials.7.064402
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发表时间:
2023
影响因子:
3.4
通讯作者:
Fuchs, Gregory D.
中科院分区:
文献类型:
--
作者:
Guo, Qiaochu;D'Addario, Anthony;Cheng, Yang;Kline, Jeremy;Gray, Isaiah;Cheung, Hil Fung;Yang, Fengyuan;Nowack, Katja C.;Fuchs, Gregory D.
Electrical switching of Néel order in an antiferromagnetic insulator is desirable as a basis for memory applications. Unlike electrically driven switching of ferromagnetic order via spin-orbit torques, electrical switching of antiferromagnetic order remains poorly understood. Here we investigate the low-field magnetic properties of 30-nm-thick,-axis-orientedHall devices using a diamond nitrogen-vacancy center scanning microscope. Using the canted moment ofas a magnetic handle on its Néel vector, we apply a saturating in-plane magnetic field to create a known initial state before letting the state relax in low field for magnetic imaging. We repeat this procedure for different in-plane orientations of the initialization field. We find that the magnetic field images are characterized by stronger magnetic textures for fields alongand, suggesting that despite the expected 3-fold magnetocrystalline anisotropy, ourthin films have an overall in-plane uniaxial anisotropy. We also study current-induced switching of the magnetic order in. We find that the fraction of the device that switches depends on the current pulse duration, amplitude, and direction relative to the initialization field.