A practical theoretical formalism for atomic multielectron processes: direct multiple ionization by a single auger decay or by impact of a single electron or photon
A practical theoretical formalism for atomic multielectron processes: direct multiple ionization by a single auger decay or by impact of a single electron or photon
复制标题
原子多电子过程的实用理论形式：通过单个螺旋衰变或通过单个电子或光子的影响直接多重电离
DOI：
10.1088/1361-6455/aab195
复制
发表时间：
2017-09
期刊：
影响因子：
--
通讯作者：
Yuan Jianmin
中科院分区：
文献类型：
--
作者：
Liu Pengfei;Zeng Jiaolong;Yuan Jianmin
多电子过程广泛存在于原子、分子、团簇和凝聚态物质中，当它们与高能粒子或强激光场相互作用时。直接多电子过程（DMEP）是一般多电子过程中最复杂、最难以理论描述的过程。本文基于关联多体绿色函数描述的原子碰撞理论，提出了一种统一的、精确的理论形式，描述了单电子或单光子碰撞下原子的多重俄歇衰变和多重电离.这样一个实际的治疗是可能的，考虑到不同的原子（物质波）的相干性特征在初始和最终状态。首先以电子碰撞直接双电离过程为例，说明了连续电子的相干特性是如何被破坏的。直接双电离过程与单电离过程完全不同，在单电离过程中可以保持完全的干扰。根据电子碰撞直接双电离、直接双俄歇和三俄歇衰变以及双光电离和三光电离过程的敲出（KO）和甩出（SO）机制，得到了连续谱电子间能量关联和能量分辨微分和积分截面的详细表达式。通过增加以下KO和SO过程的贡献，可以直接扩展到比三重电离更高阶的DMEP。应用该方法研究了C+、N+和O+的电子碰撞双电离过程，C +1s2s22p22D和2P的K壳层激发态的直接双俄歇和三俄歇衰变，以及Li的双俄歇和TPI.与实验和其他理论研究的比较表明，我们的理论形式主义是准确和有效的治疗原子多电子过程。
Multiple electron processes occur widely in atoms, molecules, clusters, and condensed matters when they are interacting with energetic particles or intense laser fields. Direct multielectron processes (DMEP) are the most complicated among the general multiple electron processes and are the most difficult to describe theoretically. In this work, a unified and accurate theoretical formalism is proposed on the DMEP of atoms including the multiple auger decay and multiple ionization by an impact of a single electron or a single photon based on the atomic collision theory described by a correlated many-body Green's function. Such a practical treatment is made possible by taking consideration of the different coherence features of the atoms (matter waves) in the initial and final states. We first explain how the coherence characteristics of the ejected continuum electrons is largely destructed, by taking the electron impact direct double ionization process as an example. The direct double ionization process is completely different from the single ionization where the complete interference can be maintained. The detailed expressions are obtained for the energy correlations among the continuum electrons and energy resolved differential and integral cross sections according to the separation of knock-out (KO) and shake-off (SO) mechanisms for the electron impact direct double ionization, direct double and triple auger decay, and double and triple photoionization (TPI) processes. Extension to higher order DMEP than triple ionization is straight forward by adding contributions of the following KO and SO processes. The approach is applied to investigate the electron impact double ionization processes of C+, N+, and O+, the direct double and triple auger decay of the K-shell excited states of C+ 1 s 2 s 2 2 p 2 2 D and 2 P , and the double and TPI of lithium. Comparisons with the experimental and other theoretical investigations wherever available in the literature show that our theoretical formalism is accurate and effective in treating the atomic multielectron processes.
登录
查看更多内容
影响因子：
2.9
作者：
M. Pindzola;F. Robicheaux;J. Colgan
通讯作者：
M. Pindzola;F. Robicheaux;J. Colgan
影响因子：
2.9
作者：
Pengfei Liu;J. Zeng;A. Borovik;S. Schippers;A. Müller
通讯作者：
Pengfei Liu;J. Zeng;A. Borovik;S. Schippers;A. Müller
影响因子：
8.6
作者：
Ford;Moore;Coplan;Cooper;Doering
通讯作者：
Ford;Moore;Coplan;Cooper;Doering
影响因子：
8.6
作者：
A. Kheifets;I. Bray
通讯作者：
A. Kheifets;I. Bray
影响因子：
2.9
作者：
Fuyang Zhou;Yulong Ma;Y. Qu
通讯作者：
Fuyang Zhou;Yulong Ma;Y. Qu