Simultaneous observation of millisecond dynamics in atomistic structure, force and conductance on the basis of transmission electron microscopy
Simultaneous observation of millisecond dynamics in atomistic structure, force and conductance on the basis of transmission electron microscopy
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DOI：
10.1143/jjap.40.l170
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发表时间：
2001-02-15
期刊：
影响因子：
--
通讯作者：
Enomoto, Y
中科院分区：
文献类型：
--
作者：
Kizuka, T;Ohmi, H;Enomoto, Y
高分辨透射电子显微镜（HRTEM）已发展成为具有原子力显微镜和扫描隧道显微镜功能的电子显微镜。在HRTEM成像过程中，以1/30 - 1/3840 s的间隔同时观察到了亚纳米牛顿尺度的力和电导的动态变化.原子尺度材料力学的实验基础是在现有显微镜的基础上发展起来的。
High-resolution transmission electron microscopy (HRTEM) has been developed to possess functions of atomic force microscopy and scanning tunneling microscopy. Dynamics of subnano Newton-scale force and conductance were simultaneously observed at intervals of 1/30-1/3840 s during HRTEM imaging of contact, deformation and fracture processes between nanometer-sized tips. The experimental basis of the atomic-scale mechanics of materials was developed on the basis of the present microscopy.