Review of data processing techniques for density profile evaluation from broadband FM-CW reflectometry on ASDEX Upgrade

Review of data processing techniques for density profile evaluation from broadband FM-CW reflectometry on ASDEX Upgrade
复制标题

DOI:
10.1088/0029-5515/46/9/s05
复制
发表时间:
2006-09
期刊:
影响因子:
3.3
通讯作者:
P. Varela;M. Manso;A. Silva;the CFN Team;the ASDEX Upgrade Team
P. Varela;M. Manso;A. Silva;the CFN Team;the ASDEX Upgrade Team
中科院分区:
物理与天体物理1区
文献类型:
--
作者:
P. Varela;M. Manso;A. Silva;the CFN Team;the ASDEX Upgrade Team

文献摘要

被引文献

相似文献

预计ITER将使用宽带FM-CW反射仪来测量主等离子体和偏滤器等离子体中的电子密度分布。这些测量应为机器控制和操作提供关键信息,作为磁诊断的补充,并要求自动评估所有相关等离子体场景中的密度分布。由于等离子体湍流对探测微波的影响,这是一项复杂的任务。自1991年以来,ASDEX升级宽带反射仪诊断在硬件开发和数据处理方面做出了重大和持续的努力,这导致密度剖面测量的显著改进。在这里,我们回顾了用于剖面评价的数据处理技术的演变。我们首先描述在ASDEX升级中(以及在其他机器上)应用的标准方法,并讨论它们的优点和局限性。其次,介绍了ASDEX升级中实现的新技术,并讨论了由此带来的简档评估方面的改进。结果表明,这是由于能够利用轮廓测量的先验知识和ASDEX升级反射仪诊断的高级功能。
Broadband FM-CW reflectometry is foreseen to be used on ITER to measure the electron density profile, both in the main and divertor plasmas. These measurements should provide crucial information for machine control and operation, in complement to magnetic diagnostics, and require the automatic evaluation of the density profile in all relevant plasma scenarios. This is a complex task due to the effects of plasma turbulence on the probing microwaves. A major and continued effort both on hardware development and data processing has been made in the ASDEX Upgrade broadband reflectometry diagnostic since 1991, which has led to noticeable improvements of density profile measurements. Here we review the evolution of the data processing techniques for profile evaluation. We first describe the standard methods that have been applied in ASDEX Upgrade (as well as in other machines) and discuss their advantages and limitations. Secondly, the novel techniques implemented in ASDEX Upgrade are presented and the resulting improvements on profile evaluation are discussed. It is shown that these are due to the ability to use both the a priori knowledge about profile measurements and the advanced features of the ASDEX Upgrade reflectometry diagnostic.