Performance test of Si PIN photodiode line scanner for thermal neutron detection
Performance test of Si PIN photodiode line scanner for thermal neutron detection
复制标题
热中子探测用Si PIN光电二极管线扫描仪性能测试
DOI:
10.1016/j.nima.2011.08.014
复制
发表时间:
2011
影响因子:
1.4
通讯作者:
A. Yoshikawa
中科院分区:
文献类型:
--
作者:
D. Totsuka;T. Yanagida;K. Fukuda;N. Kawaguchi;Y. Fujimoto;J. Pejchal;Y. Yokota;A. Yoshikawa
Thermal neutron imaging using Si PIN photodiode line scanner and Eu-doped LiCaAlF6crystal scintillator has been developed. The pixel dimensions of photodiode are 1.18mm (width)×3.8mm (length) with 0.4mm gap and the module has 192 channels in linear array. The emission peaks of Eu-doped LiCaAlF6after thermal neutron excitation are placed at 370 and 590nm, and the corresponding photon sensitivities of photodiode are 0.04 and 0.34A/W, respectively. Polished scintillator blocks with a size of 1.18mm (width)×3.8mm (length)×5.0mm (thickness) were wrapped by several layers of Teflon tapes as a reflector and optically coupled to the photodiodes by silicone grease. JRR-3 MUSASI beam line emitting 13.5meV thermal neutrons with the flux of 8×105n/cm2s was used for the imaging test. As a subject for imaging, a Cd plate was moved at the speed of 50mm/s perpendicular to the thermal neutron beam. Analog integration time was set to be 416.6μs, then signals were converted by a delta–sigma A/D converter. After the image processing, we successfully obtained moving Cd plate image under thermal neutron irradiation using PIN photodiode line scanner coupled with Eu-doped LiCaAlF6scintillator.