An Inquiry-Based Introduction to Atomic Force Microscopy Techniques through Optical Storage Disc Surface Imaging
An Inquiry-Based Introduction to Atomic Force Microscopy Techniques through Optical Storage Disc Surface Imaging
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DOI：
10.1021/acs.jchemed.2c00291
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发表时间：
2022-07
影响因子：
3
通讯作者：
Senetta F. Bancroft;M. Ali;P. Kohli
中科院分区：
文献类型：
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作者：
Senetta F. Bancroft;M. Ali;P. Kohli
扫描探针显微镜，如原子力显微镜已成为越来越多的综合性和相关的本科实验室调查。原子力显微镜（AFM）作为“世界的手和眼睛”，继续用于创新数据存储的重写过程，并探索适用于超快，非易失性，高密度存储器存储的新材料。与AFM技术共同发展的光学存储盘（OSD）相对便宜，并且易于购买。因此，它们可以作为一个相关的现象，为本科生探索纳米材料的结构和宏观功能，通过原子力显微镜。这里介绍的引导式探究调查通过识别三个未知的OSD样本（CD，DVD或蓝光）向学生介绍AFM的设计和基本功能。每个OSD的表面是通过学生的地形和力曲线数据的收集和解释，使用原子力显微镜，以确定包含坑和土地的凹槽结构的差异，理论存储容量的估计，并最终区分OSD类型通过比较他们的数据和计算已知的结构和容量。
Scanning probe microscopy such as atomic force microscopy has become increasingly integrated and relevant in undergraduate laboratory investigations. As the “hands and eyes of the nanoworld”, atomic force microscopes (AFMs) continue to be used to innovate the nanowriting process for data storage and in the exploration of novel materials suitable for ultrafast, nonvolatile, high density memory storage. Optical storage discs (OSDs) coevolved with AFM technology, are relatively inexpensive, and are easily available for purchase. They can, consequently, serve as a relevant phenomenon for undergraduate students to explore nanoscale material structure and macroscopic function through an AFM. The guided inquiry investigation presented here introduces students to the design and basic functions of an AFM through their identification of three unknown OSD samples (CD, DVD, or Blu-ray). The surface of each OSD is explored through students’ collection and interpretation of topographic and force curve data using an AFM to identify differences in the structure of the grooves containing pits and lands, estimation of theoretical storage capacity, and finally distinguish OSD types by comparing their data and calculations to known structures and capacities.