Visibility of inverted domain structures using the second harmonic generation microscope: Comparison of interference and non-interference cases
Visibility of inverted domain structures using the second harmonic generation microscope: Comparison of interference and non-interference cases
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DOI：
10.1364/josab.27.000888
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发表时间：
2010-05-01
影响因子：
1.9
通讯作者：
Fukui, Tatsuo
中科院分区：
文献类型：
--
作者：
Kaneshiro, Junichi;Uesu, Yoshiaki;Fukui, Tatsuo
基于三波耦合方程讨论了使用二次谐波发生 (SHG) 显微镜的倒置畴结构的可见性。在没有参考二次谐波（SH）波（无干扰情况）的情况下，畴边界处的SHG强度沿与畴壁垂直的方向急剧下降，观察为暗线。因此，非干涉SHG显微镜可以揭示域边界的位置，但不能揭示SHG干涉显微镜可以做到的域极性。在周期性极化域结构的情况下，清晰的观测标准用基波和SH波之间的波数偏移来表达。 (C) 2010 美国光学学会
The visibility of inverted domain structures using the second harmonic generation (SHG) microscope is discussed based upon the three-wave coupling equations. Without reference second harmonic (SH) waves (non-interference case), the SHG intensity at a domain boundary decreases steeply along the perpendicular direction to the domain wall, which is observed as a dark line. Thus the non-interference SHG microscope reveals the location of domain boundaries but not the domain polarity which the SHG interference microscope can do. In the case of periodically poled domain structures, the clear observation criterion is expressed with the wave-number offset between the fundamental and SH waves. (C) 2010 Optical Society of America