EXTENDED X-RAY ABSORPTION FINE-STRUCTURE INVESTIGATIONS OF NICKEL HYDROXIDES
EXTENDED X-RAY ABSORPTION FINE-STRUCTURE INVESTIGATIONS OF NICKEL HYDROXIDES
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DOI：
10.1021/j100364a005
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发表时间：
1990-01-11
影响因子：
--
通讯作者：
HOFFMAN, RW
中科院分区：
文献类型：
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作者：
PANDYA, KI;OGRADY, WE;HOFFMAN, RW
用扩展X射线吸收精细结构（EXAFS）技术研究了a-Ni（OH）_2和0-Ni（OH）_2在室温和液氮温度下的结构。用NiO和Ni箔EXAFS谱的参考相位函数和振幅函数对0-Ni（OH）2的EXAFS数据进行了分析。以NiO和β-Ni（OH）_2为参比化合物，分析了α-Ni（OH）_2的EXAFS谱。在a-Ni（OH）2的晶格中观察到0.05 μ m的Ni-Ni距离的收缩，与i3-Ni（OH）2相比。原位EXAFS谱分析表明，α-Ni（OH）2膜的水化后，包括在Ni-0配位数的增加微妙的变化。
The extended X-ray absorption fine structure (EXAFS) technique was used toinvestigate the structures of a-Ni (OH) 2 and 0-Ni (OH) 2 samples at room temperature and at liquid nitrogen temperature. The EXAFS data for0-Ni (OH) 2 were analyzed by using the reference phase andamplitude functions derived from the NiO and Ni foil EXAFS spectra. The EXAFS spectra of a-Ni (OH) 2 were analyzed by using NiO as well as/3-Ni (OH) 2 as the reference compounds. A contraction in the Ni-Ni distance of 0.05 Á in the lattice of a-Ni (OH) 2 was observed in comparison to/3-Ni (OH) 2. Analysis of in situ EXAFS spectra of an a-Ni (OH) 2 film indicated subtle changes upon hydration including an increase in the Ni-0 coordination number.