Highly accelerated lifetime testing of potassium sodium niobate thin films
Highly accelerated lifetime testing of potassium sodium niobate thin films
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DOI：
10.1063/1.4995618
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发表时间：
2017-11
影响因子：
4
通讯作者：
Wanlin Zhu;Betul Akkopru‐Akgun;S. Trolier-McKinstry
中科院分区：
文献类型：
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作者：
Wanlin Zhu;Betul Akkopru‐Akgun;S. Trolier-McKinstry
在电场160 ~ 350 kV/cm、温度90 ~ 210 °C条件下，对2 μ m和3 μm厚的铌酸钾钠[（K0.5，Na0.5）NbO 3，KNN]薄膜进行了高加速寿命试验。根据每种测量条件下多达22个电极的失效时间的对数正态分布图确定失效时间（t50）。2 μm和3 μ mKNN薄膜的失效激活能分别为0.74 ± 0.04eV和0.92 ± 0.05eV。3 μm薄膜的电压加速因子为3.5 ± 0.34。2 μm薄膜的t50随电场的变化呈现两个N值相近的区域，分别为6.67和6.94 ± 0.23。利用能量色散X射线能谱研究了KNN薄膜中Na+和K+离子的分布。
Highly accelerated lifetime tests of 2 and 3 μm thick potassium sodium niobate [(K0.5, Na0.5)NbO3, KNN] films with different thicknesses were measured under electric fields ranging from 160 to 350 kV/cm and temperatures ranging from 90 to 210 °C. The medium time to failure (t50) was determined from a lognormal distribution plot of failure times of up to 22 electrodes per measurement condition. The activation energy (Ea) for failure was 0.74 ± 0.04 eV and 0.92 ± 0.05 eV for the 2 μm and 3 μm KNN films, respectively. The voltage acceleration factor was 3.5 ± 0.34 for the 3 μm film. But the electric field dependence of t50 for the 2 μm film showed two regions with similar N, 6.67 and 6.94 ± 0.23, respectively. Energy-dispersive X-ray spectroscopy was employed to investigate the Na+ and K+ ion distributions in KNN films.