Flux-flow instability in 2H-NbSe2 superconducting thin crystals stamped on SiO2/Si substrates
Flux-flow instability in 2H-NbSe2 superconducting thin crystals stamped on SiO2/Si substrates
复制标题
SiO2/Si 基底上冲压的 2H-NbSe2 超导薄晶体中的通量流动不稳定性
DOI:
10.1088/1742-6596/969/1/012073
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发表时间:
2018
期刊:
影响因子:
--
通讯作者:
Kokubo N
中科院分区:
文献类型:
--
作者:
Yoshida J;Ando H;Kokubo N
We have investigated the nonlinear flux flow in the mixed state of 2H-NbSe 2 superconducting thin crystals stamped on SiO 2/Si substrates. The nonlinearity in the flux flow behavior is marked with upward bending and subsequent voltage jump in the current-voltage characteristics. The results were analyzed within the framework of a modified Larkin-Ovchinnikov model, including the estimation of inelastic relaxation time of quasiparticles in the crystal and heat transfer coefficient between the crystal and SiO 2/Si substrate. The analysis provides an insight into the quality of acoustic match at the crystal-substrate interface.