Luminescence of pulsed-laser-deposited SrAl2O4:: Eu, Dy thin film and its role as a stress indicator
Luminescence of pulsed-laser-deposited SrAl2O4:: Eu, Dy thin film and its role as a stress indicator
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DOI：
10.1149/1.2012947
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发表时间：
2005-01-01
影响因子：
3.9
通讯作者：
Kim, JS
中科院分区：
文献类型：
--
作者：
Sohn, KS;Park, DH;Kim, JS
本研究的最终目标是在机械试件表面制备一种SrAl2O4：Eu，Dy薄膜荧光粉，作为测试过程中的应力或裂纹指示器。首先，利用脉冲激光沉积(PLD)技术在石英玻璃、Si(111)、Si(001)和波纹石英玻璃等传统衬底上制备了SrAl2O4：Eu，Dy薄膜荧光粉。优化了工艺参数，试图提高SrAl2O4：Eu，Dy薄膜荧光粉的发光效率。SrAl2O4：Eu，Dy薄膜荧光粉的最佳PLD工艺条件不同于其他常规氧化物薄膜荧光粉，在PLD过程中不需要氧气供应，氧化气氛中的后沉积退火无效，波纹衬底没有显著提高提取效率。采用最佳PLD工艺条件，在常规衬底上初步沉积的基础上，在由多晶Al_2O_3组成的致密拉伸试件表面沉积了SrAl_2O_4：Eu，Dy薄膜荧光粉，并通过实际机械试验验证了其作为应力或裂纹指示剂的适用性。(C)2005年电化学会。
The ultimate goal of the present investigation was to develop an SrAl2O4:Eu,Dy thin-film phosphor on the surface of mechanical test specimens to act as a stress or crack indicator during testing. As a preliminary step, SrAl2O4: Eu, Dy thin-film phosphors were deposited on several conventional substrates such as quartz glass, Si(111), Si(001), and corrugated quartz glass using a pulsed laser deposition (PLD) technique. Processing parameters were optimized, in an attempt to enhance the efficiency of luminescence of the SrAl2O4: Eu, Dy thin-film phosphor. The optimal PLD processing conditions for the SrAl2O4: Eu, Dy thin-film phosphor were different from that for other conventional oxide thin-film phosphors in that an oxygen supply during the PLD process was not necessary, a postdeposition annealing in an oxidizing atmosphere was ineffective, and the corrugated substrate did not have a significantly enhanced extraction efficiency. By adopting the best PLD processing conditions, based on the preliminary depositions on conventional substrates, the SrAl2O4: Eu, Dy thin-film phosphor was deposited on the surface of a compact tension specimen composed of polycrystalline Al2O3 and the applicability of the SrAl2O4: Eu, Dy thin-film phosphor as a stress or crack indicator was verified in an actual mechanical test. (c) 2005 The Electrochemical Society.