DIRECT MEASUREMENT OF COLLOIDAL FORCES USING AN ATOMIC FORCE MICROSCOPE
DIRECT MEASUREMENT OF COLLOIDAL FORCES USING AN ATOMIC FORCE MICROSCOPE
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DOI：
10.1038/353239a0
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发表时间：
1991-09-19
期刊：
影响因子：
64.8
通讯作者：
PASHLEY, RM
中科院分区：
文献类型：
--
作者：
DUCKER, WA;SENDEN, TJ;PASHLEY, RM
胶体颗粒之间的作用力控制着各种材料的行为，包括油漆、纸张、土壤、粘土和（在某些情况下）细胞。在这里，我们描述了使用原子力显微镜直接测量一个平面表面和单个胶体颗粒之间的力。将半径为3.5 μ m的二氧化硅球颗粒连接到显微镜中的力传感器上，并在氯化钠溶液中测量颗粒和表面之间的力。测量结果与胶体力的双层理论1，2一致，尽管在非常短的距离上存在可能归因于水合力3-6或表面粗糙度的偏差，并且与先前对宏观系统4-6的研究一致。 对于工业环境中经常遇到的各种颗粒和纤维材料，只要它们可以连接到显微镜探头上，就可以进行类似的测量。
THE forces between colloidal particles dominate the behaviour of a great variety of materials, including paints, paper, soil, clays and (in some circumstances) cells. Here we describe the use of the atomic force microscope to measure directly the force between a planar surface and an individual colloid particle. The particle, a silica sphere of radius 3.5-mu-m, was attached to the force sensor in the microscope and the force between the particle and the surface was measured in solutions of sodium chloride. The measurements are consistent with the double-layer theory 1,2 of colloidal forces, although at very short distances there are deviations that may be attributed to hydration forces 3-6 or surface roughness, and with previous studies on macroscopic systems 4-6. Similar measurements should be possible for a wide range of the particulate and fibrous materials that are often encountered in industrial contexts, provided that they can be attached to the microscope probe.