Wavelength-multiplexed single-shot ptychography
Wavelength-multiplexed single-shot ptychography
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DOI：
10.1016/j.ultramic.2021.113418
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发表时间：
2021-11-18
期刊：
影响因子：
2.2
通讯作者：
Adams, Daniel
中科院分区：
文献类型：
--
作者：
Barolak, Jonathan;Goldberger, David;Adams, Daniel
我们提出了第一个实验演示的波长复用在单次拍摄重叠关联。具体而言，我们实验重建复杂的传输轮廓的波长无关和波长相关的对象同时为532 nm和633 nm的探测波长。此外，我们讨论了一个更一般的方法来检测器分割单次拍摄重叠关联的优点。一个最小化，以纠正不确定性的先验信息，这是需要单次拍摄的几何形状是沿着与一个新的探头约束。此外，该技术是双波长干涉测量的补充，而不需要外部参考。这项工作是使成像技术和应用，如宽带单次拍摄重叠关联，时间分辨成像多路复用重叠关联，实时检测激光微加工，等离子体成像。
We present the first experimental demonstration of wavelength-multiplexing in single-shot ptychography. Specifically, we experimentally reconstruct the complex transmission profile of a wavelength-independent and wavelength-dependent object simultaneously for 532 nm and 633 nm probing wavelengths. In addition, we discuss the advantages of a more general approach to detector segmentation in single-shot ptychography. A minimization to correct for uncertainties in a priori information that is required for single-shot geometries is presented along with a novel probe constraint. Furthermore, this technique is complementary to dual-wavelength interferometry without the need for an external reference. This work is enabling to imaging technologies and applications such as broadband single-shot ptychography, time-resolved imaging by multiplexed ptychography, real-time inspection for laser micro-machining, and plasma imaging.