Temperature Dependence of Trapping and Depth Profiles of 6_keV to 15_keV Deuterium in Carbon
Temperature Dependence of Trapping and Depth Profiles of 6_keV to 15_keV Deuterium in Carbon
复制标题
碳中 6_keV 至 15_keV 氘的捕获和深度剖面的温度依赖性
DOI:
10.1016/0022-3115(76)90309-3
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发表时间:
1976
影响因子:
3.1
通讯作者:
M. Sinha
中科院分区:
文献类型:
--
作者:
B. Scherzer;R. Behrisch;W. Eckstein;U. Littmark;J. Roth;M. Sinha
Depth profiles of 30 keV D+2and 20 keV D+2implanted into edge and basal-oriented pyrolytic graphite have been measured by means of the D(3He,α)H nuclear reaction in the temperature range of 300 to 800 K. At room temperature deuterium concentrations up to 30 at.% are found in a surface layer corresponding to the range of the ions. The measured depth profiles do not fully agree either with calculated range profiles or with the damage profiles, but are determined by the two together. At higher temperatures the deuterium concentrations decrease and the profiles broaden. At room temperature the amount of trapped deuterium increases linearly with dose below 1018deuterons/cm2. The trapping coefficient is roughly 60%. At 5 × 1018deuterons/cm2the amount of trapped deuterium in the probed layer (~4000 Å) reaches saturation and the trapping coefficient becomes zero. The saturation value decreases with increasing temperature and increases with increasing energy.