Influence of exchange bias coupling on the single-crystalline FeMn ultrathin film
Influence of exchange bias coupling on the single-crystalline FeMn ultrathin film
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DOI：
10.1063/1.1883318
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发表时间：
2005-03
影响因子：
4
通讯作者：
Jianfeng Wang;W. Kuch;L. Chelaru;F. Offi;M. Kotsugi
中科院分区：
文献类型：
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作者：
Jianfeng Wang;W. Kuch;L. Chelaru;F. Offi;M. Kotsugi
用X射线光电子能谱（XPS）研究了交换偏置耦合对无序的面心立方Fe50Mn50单晶的影响。我们发现，FeMn膜的临界厚度，反铁磁（AF）秩序的形成，改变铁磁（FM）层的磁化方向从面外到面内。表面磁光克尔效应测量（SMOKE）进一步表明临界厚度随交换偏置耦合的变化而变化。结果表明，铁锰层附近的铁锰层的自旋结构被改变的交换偏置耦合的存在和耦合的性质。我们的结果提供了直接的实验证据，表明FM和AF层之间界面处的AF自旋结构受到交换偏置耦合的强烈影响。
Polarization dependent x-ray photoemission electron microscopy was used to investigate the influence of the exchange bias coupling on the disordered ultrathin single-crystalline fcc Fe50Mn50. We find that the critical thickness of the FeMn film, where the antiferromagnetic (AF) order is formed, varies with changing the magnetization direction of the ferromagnetic (FM) layer from out-of-plane to in-plane. Surface magneto-optical Kerr effect measurements (SMOKE) further manifest the shift of the critical thickness with alternating the exchange bias coupling. It indicates that the spin structure of the FeMn layer near the FM layer is modified by the presence of exchange bias coupling and the properties of the coupling. Our results provide direct experimental evidence that the AF spin structure at the interface between the FM and AF layers is strongly influenced by the exchange bias coupling.