Pulsed-Laser Testing for Single-Event Effects Investigations
Pulsed-Laser Testing for Single-Event Effects Investigations
复制标题
DOI：
10.1109/tns.2013.2255312
复制
发表时间：
2013-04
影响因子：
1.8
通讯作者：
S. Buchner;F. Miller;V. Pouget;D. McMorrow
中科院分区：
文献类型：
--
作者：
S. Buchner;F. Miller;V. Pouget;D. McMorrow
介绍了脉冲激光在集成电路和器件单粒子效应研究中的应用。脉冲激光器的作用是提供关于SEE的空间和时间信息，当使用宽束离子源时，这些信息是不可用的。详细描述了所涉及的机制，包括光的传播和吸收的线性和非线性过程。大量的例子突出了该技术在SEE研究中的多功能性和实用性。
The application of pulsed lasers to the study of Single-Event Effects (SEEs) in integrated circuits and devices is described. The role of a pulsed laser is to provide spatial and temporal information about SEEs, information that is not available when broad-beam ion sources are used. A detailed description is given of the mechanisms involved, including light propagation and absorption by both linear and non-linear processes. Numerous examples highlight the versatility and usefulness of the technique in the study of SEEs.