Fluorescence antibunching microscopy
Fluorescence antibunching microscopy
复制标题
荧光反聚束显微镜
DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
D. Oron
中科院分区：
文献类型：
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作者：
O. Schwartz;J. Levitt;D. Oron
利用光的量子特性突破衍射极限是近年来人们研究的热点。本文是一项研究的进展报告，旨在通过实验证明光子反聚束，一个非经典的发射统计特性所表现出的大多数发射器作为荧光标记启用超分辨率显微镜技术。我们发现，光子反聚束产生的相关性，编码高空间频率的荧光发射体的分布信息。在标准荧光显微镜设置中使用光子计数仪器检测这些相关性允许荧光团染色样品的三维超分辨率成像。该技术为现有的超分辨工具提供了一种量子替代方案。
Utilizing quantum properties of light to break the diffraction limit has been the goal of intense research in the recent years. This paper is a progress report on a study aimed at experimentally demonstrating a superresolution microscopy technique enabled by photon antibunching, a non-classical emission statistics feature exhibited by most emitters used as fluorescent markers. We find that photon antibunching gives rise to correlations that encode high spatial frequency information on the distribution of fluorescent emitters. Detecting these correlations using photon counting instrumentation in a standard fluorescence microscope setting allows for three-dimensional superresolution imaging of fluorophore stained samples. The technique provides a quantum alternative to the established superresolution tools.