Fast and adjustable-resolution grazing-incidence x-ray liquid surface diffraction
Fast and adjustable-resolution grazing-incidence x-ray liquid surface diffraction
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快速、分辨率可调的掠入射 X 射线液体表面衍射
DOI：
10.1063/1.1790582
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发表时间：
2004
影响因子：
1.6
通讯作者：
A. Jucha
中科院分区：
文献类型：
--
作者：
P. Fontaine;M. Bordessoule;A. Jucha
我们开发了一种配置，使用一个二维的探测器掠入射的X射线衍射的朗缪尔单分子膜，更一般地说，二维粉末的表面衍射。与使用线性检测器结合索勒狭缝的经典设置相比，使用具有可比信噪比的相同X射线源（同步加速器偏转磁体），采集时间减少了一个数量级（从超过1小时到几分钟）。 此外，实验分辨率可以通过改变垂直狭缝（水平间隙）来调整，并且对于小的差距值，与用索勒狭缝和线性检测器获得的分辨率相比，可以实现更好的分辨率。
We developed a configuration using a two-dimensional detector for grazing incidence x-ray diffraction on Langmuir monolayers and, more generally, for surface diffraction on two-dimensional powders. Compared to the classical setup using a linear detector combined with Soller slits, the acquisition time is reduced by an order of magnitude (from more than 1 h to a few minutes) using the same x-ray source (synchrotron bending magnet) with a comparable signal to noise ratio. Moreover, experimental resolution can be adjusted by varying a vertical slit (horizontal gap) and, for small values of the gap, better resolution can be achieved compared to the one obtained with the Soller slits and linear detector.