Detection and correction of the misplacement error in terahertz spectroscopy by application of singly subtractive Kramers-Kronig relations
Detection and correction of the misplacement error in terahertz spectroscopy by application of singly subtractive Kramers-Kronig relations
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DOI：
10.1103/physrevb.72.125107
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发表时间：
2005-05
影响因子：
3.7
通讯作者：
V. Lucarini;Y. Ino;K. Peiponen;M. Kuwata-Gonokami
中科院分区：
文献类型：
--
作者：
V. Lucarini;Y. Ino;K. Peiponen;M. Kuwata-Gonokami
In THz reflection spectroscopy the complex permittivity of an opaque medium is determined on the basis of the amplitude and phase of the reflected wave. There is usually a problem of phase error due to misplacement of the reference sample. Such experimental error brings inconsistency between phase and amplitude invoked by the causality principle. We propose a rigorous method to solve this relevant experimental problem by using an optimization method based upon singly subtractive Kramers-Kronig relations. The applicability of the method is demonstrated for measured data on an $n$-type undoped (100) InAs wafer in the spectral range from $0.5\phantom{\rule{0.3em}{0ex}}\text{to}\phantom{\rule{0.3em}{0ex}}2.5\phantom{\rule{0.3em}{0ex}}\mathrm{THz}$.
In THz reflection spectroscopy the complex permittivity of an opaque medium is determined on the basis of the amplitude and phase of the reflected wave. There is usually a problem of phase error due to misplacement of the reference sample. Such experimental error brings inconsistency between phase and amplitude invoked by the causality principle. We propose a rigorous method to solve this relevant experimental problem by using an optimization method based upon singly subtractive Kramers-Kronig relations. The applicability of the method is demonstrated for measured data on an $n$-type undoped (100) InAs wafer in the spectral range from $0.5\phantom{\rule{0.3em}{0ex}}\text{to}\phantom{\rule{0.3em}{0ex}}2.5\phantom{\rule{0.3em}{0ex}}\mathrm{THz}$.