Orientation Imaging in the Transmission Electron Microscope
Orientation Imaging in the Transmission Electron Microscope
复制标题
透射电子显微镜中的定向成像
DOI：
--
复制
发表时间：
1998
期刊：
影响因子：
--
通讯作者：
D. Dingley
中科院分区：
文献类型：
--
作者：
S. Wright;D. Dingley
扫描电子显微镜 (SEM) 中的取向成像显微镜 (OIM) 已被证明是研究多晶微结构中局部取向关系的强大工具。由于 SEM 中电子背散射衍射的固有局限性，OIM 技术仅限于微米级结构的研究。透射电子显微镜（TEM）的并行技术将能够对较小尺度结构中的局部取向关系进行类似的研究。本报告回顾了使用暗场成像将 OIM 技术应用于 TEM 的开发工作，并提出了一些初步结果。
Orientation Imaging Microscopy (OIM) in the scanning electron microscope (SEM) has proven itself to be a powerful tool for investigating local orientation relationships in polycrystalline microstructures. Because of the inherent limitations of electron backscatter diffraction in the SEM, the OIM technique is limited to the investigation of structures at the micron scale. A parallel technique for the transmission electron microscope (TEM) would enable similar studies of local orientation relationships in smaller scale structures to be performed. This report reviews development work on adapting the OIM technique to the TEM using dark field imaging and presents some preliminary results.