Study on the AFM Force Curve Common Errors and Their Effects on the Calculated Nanomechanical Properties of Materials
Study on the AFM Force Curve Common Errors and Their Effects on the Calculated Nanomechanical Properties of Materials
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DOI：
10.1155/2016/2456378
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发表时间：
2016-01-01
影响因子：
2.7
通讯作者：
Kamarul, T.
中科院分区：
文献类型：
--
作者：
Almasi, D.;Sharifi, R.;Kamarul, T.
原子力显微镜 (AFM) 力曲线因其高分辨率而被广泛用于确定材料的机械性能，可以测量非常低（皮牛顿）的力和小至纳米的距离。然而，有时由于 AFM 压电体的磁滞现象，从 AFM 获得的合力曲线与从更典型的纳米压痕力曲线获得的合力曲线略有不同。在这项研究中，通过 AFM 纳米压痕和纳米力学测试系统评估了磺化聚醚醚酮 (SPEEK) 处理层或裸露聚醚醚酮 (PEEK) 的纳米力学性能，以探讨由于 AFM 压电磁滞而导致计算的纳米力学性能可能出现的误差。结果表明，AFM压电体的磁滞现象导致了材料纳米力学性能计算的误差。
The atomic force microscope (AFM) force curve has been widely used for determining the mechanical properties of materials due to its high resolution, whereby very low (piconewton) forces and distances as small as nanometers can be measured. However, sometimes the resultant force curve obtained from AFM is slightly different from those obtained from a more typical nanoindentation force curve due to the AFM piezo's hysteresis. In this study the nanomechanical properties of either a sulfonated polyether ether ketone (SPEEK) treated layer or bare polyether ether ketone (PEEK) were evaluated via AFM nanoindentation and a nanomechanical test system to probe the possible error of the calculated nanomechanical properties due to the AFM piezo's hysteresis. The results showed that AFM piezo's hysteresis caused the error in the calculated nanomechanical properties of the materials.