Polarization suppression in Pb(Zr,Ti)O3 thin films
Polarization suppression in Pb(Zr,Ti)O3 thin films
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DOI:
10.1063/1.359083
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发表时间:
1995-06
影响因子:
3.2
通讯作者:
W. L. Warren;D. Dimos;B. Tuttle;G. Pike;R. W. Schwartz;P. Clews;D. Mcintyre
中科院分区:
文献类型:
--
作者:
W. L. Warren;D. Dimos;B. Tuttle;G. Pike;R. W. Schwartz;P. Clews;D. Mcintyre
Switchable polarization can be suppressed in Pb(Zr,Ti)O3 thin films by optical, thermal, electrical, and reducing processes. The optical suppression effect occurs by biasing the ferroelectric near the switching threshold and illuminating the material with band gap light; the thermal suppression effect occurs by biasing the ferroelectric near the switching threshold and heating the material to ≊100 °C. The electrically induced suppression effect, known as electrical fatigue, occurs by subjecting the ferroelectric capacitor to repeated polarization reversals. We find that the suppressed polarization in these three cases can be restored to essentially its initial polarization value by creating electronic charge carriers in the ferroelectric. This strongly suggests that all three forms of degradation largely involve locking domains by electronic charge trapping at domain boundaries. The fourth form of polarization suppression, a reducing treatment, was obtained by annealing the crystallized PZT films at 400 °...