Transport properties of Al/Ni and Al/Ag multilayer systems
Transport properties of Al/Ni and Al/Ag multilayer systems
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DOI:
10.1088/0953-8984/3/46/008
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发表时间:
1991-11
期刊:
影响因子:
--
通讯作者:
H. Sato;I. Sakamoto;C. Fierz
中科院分区:
文献类型:
--
作者:
H. Sato;I. Sakamoto;C. Fierz
The electrical resistivity, Hall effect, magnetoresistance and thermoelectric power of Al/Ni and Al/Ag sputtered multilayer films have been measured between 1.6 K and 300 K. The temperature dependence of the electrical resistivity of Al/Ni samples with small layer periodicity shows a negative temperature coefficient at low temperatures and saturation above about 100 K. The Hall coefficient of both systems depends sensitively on their layer periodicity. A reduction of ferromagnetic moment in small wavelength Al/Ni samples was clearly observed in the Hall effect and the magnetoresistance. The possibility of some formation of intermetallic compounds in these materials is discussed based on the effect of annealing on the transport properties. The measurement of the Hall effect and the magnetoresistance in multilayer systems gives various information about their magnetic properties.