The Fe/ZnO(0 0 0 1) interface: Formation and thermal stability

The Fe/ZnO(0 0 0 1) interface: Formation and thermal stability
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DOI:
10.1016/j.apsusc.2007.09.020
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发表时间:
2008-02
影响因子:
6.7
通讯作者:
D. Wett;A. Demund;H. Schmidt;R. Szargan
D. Wett;A. Demund;H. Schmidt;R. Szargan
中科院分区:
材料科学1区
文献类型:
--
作者:
D. Wett;A. Demund;H. Schmidt;R. Szargan

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利用X射线光电子能谱(XPS)、俄歇电子能谱(AES)、低能电子衍射(LEED)和低能离子散射谱(LEIS)研究了超高真空(UHV)条件下制备的Fe薄膜在ZnO(0001)单晶衬底上的室温生长模式和界面反应。结果表明,Fe以准层状方式生长。在环境温度下,沉积的Fe膜还原了下面的ZnO单晶,导致在界面处的FeO和金属Zn,其部分扩散到剩余的Fe覆盖层中。退火导致Fe逐步氧化为FeO(670K)和Fe2O3(820K)。电子背散射衍射(EBSD)分析表明,Fe2O3与基体混合,形成了尖晶石相的两个(111)取向织构。铁基自旋注入在ZnO基自旋电子器件中起着重要的作用。
The room temperature growth mode and the interface reaction of Fe films on single crystalline ZnO(0001) substrates prepared in ultra high vacuum (UHV) has been investigated by means of X-ray photoelectron and Auger electron spectroscopy (XPS, AES), low energy electron diffraction (LEED) and low energy ion scattering spectroscopy (LEIS). The results show that Fe grows in the pseudo layer-by-layer mode. At ambient temperature the deposited Fe film reduces the underlying ZnO single crystal resulting in FeO at the interface and metallic Zn, which partially diffuses into the remaining Fe overlayer. Annealing leads to a stepwise oxidation of the Fe to FeO (670K) and Fe2O3(820K). The Fe2O3mixes with the substrate resulting in two (111) oriented textures of a spinel phase found by electron backscatter diffraction analysis (EBSD). Fe-based spin-injection may play a vital role for ZnO-based spintronic devices.