The Fe/ZnO(0 0 0 1) interface: Formation and thermal stability
The Fe/ZnO(0 0 0 1) interface: Formation and thermal stability
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DOI:
10.1016/j.apsusc.2007.09.020
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发表时间:
2008-02
影响因子:
6.7
通讯作者:
D. Wett;A. Demund;H. Schmidt;R. Szargan
中科院分区:
文献类型:
--
作者:
D. Wett;A. Demund;H. Schmidt;R. Szargan
The room temperature growth mode and the interface reaction of Fe films on single crystalline ZnO(0001) substrates prepared in ultra high vacuum (UHV) has been investigated by means of X-ray photoelectron and Auger electron spectroscopy (XPS, AES), low energy electron diffraction (LEED) and low energy ion scattering spectroscopy (LEIS). The results show that Fe grows in the pseudo layer-by-layer mode. At ambient temperature the deposited Fe film reduces the underlying ZnO single crystal resulting in FeO at the interface and metallic Zn, which partially diffuses into the remaining Fe overlayer. Annealing leads to a stepwise oxidation of the Fe to FeO (670K) and Fe2O3(820K). The Fe2O3mixes with the substrate resulting in two (111) oriented textures of a spinel phase found by electron backscatter diffraction analysis (EBSD). Fe-based spin-injection may play a vital role for ZnO-based spintronic devices.