A perspective on multiparameter quantum metrology: From theoretical tools to applications in quantum imaging
A perspective on multiparameter quantum metrology: From theoretical tools to applications in quantum imaging
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DOI：
10.1016/j.physleta.2020.126311
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发表时间：
2020-04-30
影响因子：
2.6
通讯作者：
Gianani, I
中科院分区：
文献类型：
--
作者：
Albarelli, F.;Barbieri, M.;Gianani, I
对一个系统的兴趣往往在于控制其演变的不同参数之间的相互作用。因此，经常需要一次访问其中的许多内容以获得完整的描述。评估如何在这种多参数估计中实现量子增强取决于对许多微妙之处的理解：建立坚实的基础是为这项任务提供未来技术的关键。在这篇文章中，我们讨论了量子多参数估计的艺术状态，特别强调其理论工具，应用到成像问题，以及对未来发展的可能途径。(C)2020 Elsevier B.V.保留所有权利。
The interest in a system often resides in the interplay among different parameters governing its evolution. It is thus often required to access many of them at once for a complete description. Assessing how quantum enhancement in such multiparameter estimation can be achieved depends on understanding the many subtleties that come into play: establishing solid foundations is key to delivering future technology for this task. In this article we discuss the state of the art of quantum multiparameter estimation, with a particular emphasis on its theoretical tools, on application to imaging problems, and on the possible avenues towards the next developments. (C) 2020 Elsevier B.V. All rights reserved.