Time-resolved X-ray photoelectron diffraction using an angle-resolved time-of-flight electron analyzer
Time-resolved X-ray photoelectron diffraction using an angle-resolved time-of-flight electron analyzer
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DOI：
10.35848/1347-4065/abb57e
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发表时间：
2020-09
影响因子：
1.5
通讯作者：
A. Ang;Yui Fukatsu;K. Kimura;Yuta Yamamoto;T. Yonezawa;Hirokazu Nitta;A. Fleurence;S. Yamamoto;I. Matsuda;Y. Yamada-Takamura;K. Hayashi
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文献类型：
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作者：
A. Ang;Yui Fukatsu;K. Kimura;Yuta Yamamoto;T. Yonezawa;Hirokazu Nitta;A. Fleurence;S. Yamamoto;I. Matsuda;Y. Yamada-Takamura;K. Hayashi
X射线光电子衍射（XPD）提供了关于材料表面和界面的原子分辨率、元素敏感的局部结构信息。在本文报道的工作中，一个二维角分辨飞行时间（2DARTOF）系统被用来进行外延硅烯的时间分辨XPD实验。来自硅烯层中不同原子位点的两个Si 2p峰分量允许提取各个XPD图案。时间分辨的测量捕获小的角度偏移的前向聚焦峰，表明激光诱导的硅烯结构的变化。在10 ns时，XPD图案似乎弛豫回到平衡状态。这项工作表明，2DARTOF系统非常适合时间分辨XPD测量。
X-ray photoelectron diffraction (XPD) provides atomic resolution, element sensitive local structure information about the surfaces and interfaces of materials. In the work reported in this paper, a two-dimensional angle resolved time-of-flight (2DARTOF) system is used to perform time-resolved XPD experiments on epitaxial silicene. The two Si 2p peak components from the different atomic sites in the silicene layer allow extraction of the individual XPD patterns. Time-resolved measurements captured small angle shifts in the forward focusing peak, indicating laser-induced changes in the silicene structure. At 10 ns, the XPD patterns appear to relax back to the equilibrium state. This work demonstrates that 2DARTOF systems are well suitable for time-resolved XPD measurements.