Investigation of irradiation effects on highly integrated leading-edge electronic components of diagnostics and control systems for LHD deuterium operation
Investigation of irradiation effects on highly integrated leading-edge electronic components of diagnostics and control systems for LHD deuterium operation
复制标题
研究 LHD 氘运行诊断和控制系统的高度集成尖端电子元件的辐照效应
DOI：
10.1088/1741-4326/aa71e8
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发表时间：
2017
期刊：
影响因子：
3.3
通讯作者：
M. Osakabe
中科院分区：
文献类型：
--
作者：
K. Ogawa;T. Nishitani;M. Isobe;I. Murata;Y. Hatano;S. Matsuyama;H. Nakanishi;K. Mukai;M. Sato;M. Yokota;T. Kobuchi;T. Nishimura;M. Osakabe
通过实时控制、快速诊断和大功率加热系统实现高温高密度等离子体。这些系统通过高度集成的电子元件进行精确控制，但可能会受到辐射损伤的严重影响。因此，应研究辐照对当前使用的电子元件的影响，以控制和测量大型螺旋装置（LHD）氘等离子体。为了精确估计 LHD 环面大厅中的辐射场，将 MCNP6 代码与截面库 ENDF B-VI 结合使用。几何形状是根据计算机辅助设计建模的。 LHD 氘运行九年以来，硅（电子元件的主要成分）的剂量表明，伽马射线的贡献占主导地位。中子辐照试验在大阪大学 OKTAVIAN 和东北大学快中子实验室进行。伽马射线照射试验在名古屋大学 Cobalt-60 照射设施进行。我们发现，由于中子通量为 3 × 106 cm−2 s−1 的中子辐照，可编程逻辑控制器 (PLC) 模块出现以太网连接故障。该中子通量相当于没有中子屏蔽的 LHD 环面大厅地下室层的预期中子通量。 PLC 的大多数模块在 100 Gy 的伽马射线剂量左右就会损坏。这与 LHD 圆环大厅九年来的剂量相当。如果仅考虑剂量，这些成分可能会存活九年以上。为了LHD作业的安全，圆环大厅内的电子元件已重新布置。
High-temperature and high-density plasmas are achieved by means of real-time control, fast diagnostic, and high-power heating systems. Those systems are precisely controlled via highly integrated electronic components, but can be seriously affected by radiation damage. Therefore, the effects of irradiation on currently used electronic components should be investigated for the control and measurement of Large Helical Device (LHD) deuterium plasmas. For the precise estimation of the radiation field in the LHD torus hall, the MCNP6 code is used with the cross-section library ENDF B-VI. The geometry is modeled on the computer-aided design. The dose on silicon, which is a major ingredient of electronic components, over nine years of LHD deuterium operation shows that the gamma-ray contribution is dominant. Neutron irradiation tests were performed in the OKTAVIAN at Osaka University and the Fast Neutron Laboratory at Tohoku University. Gamma-ray irradiation tests were performed at the Nagoya University Cobalt-60 irradiation facility. We found that there are ethernet connection failures of programmable logic controller (PLC) modules due to neutron irradiation with a neutron flux of 3 × 106 cm−2 s−1. This neutron flux is equivalent to that expected at basement level in the LHD torus hall without a neutron shield. Most modules of the PLC are broken around a gamma-ray dose of 100 Gy. This is comparable with the dose in the LHD torus hall over nine years. If we consider the dose only, these components may survive more than nine years. For the safety of the LHD operation, the electronic components in the torus hall have been rearranged.