AFM and x-ray studies on the growth and quality of Nb(110) on
AFM and x-ray studies on the growth and quality of Nb(110) on
复制标题
AFM 和 X 射线研究 Nb(110) 的生长和质量
DOI:
10.1088/0953-8984/11/13/004
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发表时间:
1999
期刊:
影响因子:
--
通讯作者:
H. Zabel
中科院分区:
文献类型:
--
作者:
B. Wölfing;K. Theis;C. Sutter;H. Zabel
We report the effect of annealing of sapphire substrate surfaces and explain the development of step patterns with large terraces. Furthermore, the epitaxial growth of Nb(110) on annealed and unannealed sapphire substrates is studied by AFM and x-ray methods. For the explanation of the well known two component line shape of transverse x-ray scans across Nb(110) Bragg peaks, a structural model is suggested.