Growth and characterization of chemical bath deposited Cd1−xZnxS thin films
Growth and characterization of chemical bath deposited Cd1−xZnxS thin films
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DOI：
10.1016/j.jallcom.2011.04.088
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发表时间：
2011-07
影响因子：
6.2
通讯作者：
R. Mariappan;M. Ragavendar;V. Ponnuswamy
中科院分区：
文献类型：
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作者：
R. Mariappan;M. Ragavendar;V. Ponnuswamy
采用化学浴沉积法，在80 ± 5 °C的醋酸镉、醋酸锌和硫脲水溶液中，在玻璃基片上沉积了Cd1−xZnxS（0 ≤x≤ 1）薄膜。采用X射线衍射仪、扫描电子显微镜（SEM）、能量色散X射线分析（EDX）、光致发光（PL）和紫外可见分光光度计研究了Cd1−xZnxS薄膜的结构、形貌、成分和光学性质。X射线衍射分析表明，当x < 0.8时，Cd 1 −xZnxS薄膜的晶体结构为六方结构。当x> 0.6时，Cd 1 −xZnxS薄膜为立方结构。将样品在350 °C下在空气中退火45分钟导致强度增加以及朝向较低散射角的偏移。从X射线衍射研究中计算了晶粒尺寸、应变、位错密度和织构系数等参数。SEM研究表明，Cd1−xZnxS薄膜的形成与均匀分布的颗粒在整个表面的基板。EDX分析显示原子百分比的含量。用光学方法测定了薄膜的带隙。研究了薄膜的光致发光谱，并对结果进行了讨论。
Cd1−xZnxS (0 ≤x≤ 1) thin films have been deposited by chemical bath deposition method on glass substrates from aqueous solution containing cadmium acetate, zinc acetate and thiourea at 80 ± 5 °C and after annealed at 350 °C. The structural, morphological, compositional and optical properties of the deposited Cd1−xZnxS thin films have been studied by X-ray diffractometer, scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX), photoluminescence (PL) and UV–vis spectrophotometer, respectively. X-ray diffraction analysis shows that forx< 0.8, the crystal structure of Cd1−xZnxS thin films was hexagonal structure. Forx> 0.6, however, the Cd1−xZnxS films were grown with cubic structure. Annealing the samples at 350 °C in air for 45 min resulted in increase in intensity as well as a shift towards lower scattering angles. The parameters such as crystallite size, strain, dislocation density and texture coefficient are calculated from X-ray diffraction studies. SEM studies reveal the formation of Cd1−xZnxS films with uniformly distributed grains over the entire surface of the substrate. The EDX analysis shows the content of atomic percentage. Optical method was used to determine the band gap of the films. The photoluminescence spectra of films have been studied and the results are discussed.