Modelization of resistive heating of carbon nanotubes during field emission
Modelization of resistive heating of carbon nanotubes during field emission
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DOI：
10.1103/physrevb.66.075406
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发表时间：
2002-08
影响因子：
3.7
通讯作者：
P. Vincent;S. Purcell;C. Journet;V. Binh
中科院分区：
文献类型：
--
作者：
P. Vincent;S. Purcell;C. Journet;V. Binh
本文利用含辐射损耗和导电损耗的一维热方程，模拟了碳纳米管在场发射过程中的电阻加热过程。模拟与我们最近的实验相对较好地一致，在实验中，我们测量了单个碳纳米管的加热到高达2000 K，在电流${I}_{\mathrm{FE}}$$\ensuremath{\approx}2 \ensuremath{\mu}\mathrm{A}.$的FE期间，对于辐射可以忽略不计的低温，模拟减少到一个解析解，为估计碳纳米管中的电流引起的加热提供了一个通用指南。这种加热的影响作为电压的函数包括在${I}_{\mathrm{FE}}$的计算中。
In this paper we simulate the resistive heating of carbon nanotubes (CNT's) during field emission (FE) using the one-dimensional heat equation including radiation and conductive losses. The simulations are in relatively good agreement with our recent experiments in which we measured the heating of individual CNT's to as high as 2000 K during FE for currents ${I}_{\mathrm{FE}}$ of $\ensuremath{\approx}2 \ensuremath{\mu}\mathrm{A}.$ For low temperatures where radiation is negligible the simulations reduce to an analytic solution that provides a universal guide to estimating current-induced heating in CNT's. The effects of this heating are included in the calculations of ${I}_{\mathrm{FE}}$ as a function of voltage.