Determining Residual Stress Depth Profiles Using the Magnetic Barkhausen Effect
Determining Residual Stress Depth Profiles Using the Magnetic Barkhausen Effect
复制标题
使用磁巴克豪森效应确定残余应力深度分布
DOI：
--
复制
发表时间：
2014
影响因子：
2.1
通讯作者：
D. Jiles
中科院分区：
文献类型：
--
作者：
L. Mierczak;Y. Melikhov;D. Jiles
提出了一种利用实测巴克豪森磁信号确定残余应力深度依赖性的新方法。这种方法改进了以前公认的做法，即相当松散地使用不同频率的巴克豪森测量来无损地确定属性的深度依赖性。本文开发了一套完整的方程，用于描述检测到的巴克豪森信号，根据材料内部产生的实际发射以及这些信号传播到表面时的情况。基础方程考虑了巴克豪森发射信号的幅值及其随距离和频率的衰减。文中还描述了巴克豪森发射振幅随应力的变化规律。提出了一个由具有不同但均匀物理性质的多层组成的样品的深度剖面的案例研究。
A new method for determining depth dependence of residual stress from measured magnetic Barkhausen signals is proposed. This method improves on the previously accepted practice, which rather loosely used Barkhausen measurements at different frequencies for nondestructively determining the depth dependence of properties. This paper develops a complete set of equations for describing the detected Barkhausen signals in terms of the actual emissions that are generated inside the material and how these appear when they propagate to the surface. The underlying equations consider the Barkhausen emission signal amplitude and its decay with distance and frequency. The variation of Barkhausen emission amplitude with stress is also described. A case study of depth profiling in a specimen that consists of multiple layers with different, but uniform, physical properties is presented.