X-ray micro-tomography using white beam radiation from SPring-8
X-ray micro-tomography using white beam radiation from SPring-8
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DOI：
10.1088/1748-0221/8/07/p07018
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发表时间：
2013-07
影响因子：
1.3
通讯作者：
M. Hoshino;K. Uesugi;T. Sera;N. Yagi
中科院分区：
文献类型：
--
作者：
M. Hoshino;K. Uesugi;T. Sera;N. Yagi
研制了一种白色束X射线显微层析成像系统。在全反射条件下，使用平面镜消除能量高于反射镜临界能量的X射线。为了扩大反射光束的视场，使用简单的机械弯曲器在垂直方向上扩展光束。使用快速旋转样品台以0.5秒的扫描时间获得单个断层扫描数据集。由标准样品的线性吸收系数估计了在层析测量中对图像形成有贡献的主导X射线能量。
An X-ray micro-tomography system using white beam radiation was developed. A flat mirror was used to eliminate X-rays with energies higher than the critical energy of the mirror under the total reflection condition. To enlarge the field of view in the reflected beam, a simple mechanical bender was used to expand the beam in the vertical direction. A single tomographic dataset was obtained with the scanning time of 0.5sec using a fast rotational sample stage. The dominant X-ray energy which contributed to the image formation in the tomographic measurement was estimated from the linear absorption coefficient of the standard samples.