Cytological analysis of wheat infection by the leaf blotch pathogen Mycosphaerella graminicola
Cytological analysis of wheat infection by the leaf blotch pathogen Mycosphaerella graminicola
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DOI：
10.1017/s0953756299002294
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发表时间：
2000-09-01
影响因子：
--
通讯作者：
Howard, RJ
中科院分区：
文献类型：
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作者：
Duncan, KE;Howard, RJ
利用差示干涉差光、激光共聚焦扫描和低温扫描电镜技术，研究了小麦生球腔菌（Mycosphaerella graminicola）侵染小麦的过程。真菌发育的几个方面已经被记录，包括细胞外卷云和胚基质的存在，以及营养敏感的形态发生。共聚焦激光扫描显微镜的使用是非常宝贵的记录病原体入侵和症状发展的时间进程。这些数据被用来生成M的无性感染周期的概要图。Graminicola，以衡量各种作物保护策略的功效。
We have investigated the wheat infection process of Mycosphaerella graminicola (teleomorph of Septoria tritici) through the combined application of differential interference contrast light, confocal laser scanning, and cryo-scanning electron microscopies. Several aspects of fungal development have been documented, including the presence of extracellular cirrus and germling matrices, as well as nutrient-sensitive morphogenesis. The use of confocal laser scanning microscopy was invaluable in documenting the time course of pathogen invasion and symptom development. These data were used to generate summary diagrams of the asexual infection cycle of M. graminicola, to benchmark the efficacy of various crop protection strategies.