QUANTITATIVE-ANALYSIS OF THIN SPECIMENS
QUANTITATIVE-ANALYSIS OF THIN SPECIMENS
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DOI：
10.1111/j.1365-2818.1975.tb03895.x
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发表时间：
1975-01-01
期刊：
影响因子：
--
通讯作者：
LORIMER, GW
中科院分区：
文献类型：
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作者：
CLIFF, G;LORIMER, GW
本文报道了利用能量色散X射线探测器在电子显微镜下对薄片进行分析的结果。薄样品和能量色散X射线探测器的极端稳定性的结合使X射线产生-探测效率与特征X射线能量的校准曲线的实验测定成为可能。分析时无需参考标准品，利用校准曲线即可进行定量分析。
Results are reported concerning the use of an energy dispersive X‐ray detector to carry out the analysis of thin foils in the electron microscope. The combination of a thin specimen and the extreme stability of the energy dispersive X‐ray detector enables the experimental determination of a calibration curve of X‐ray production—detection efficiency vs characteristic X‐ray energy. Quantitative analysis can be carried out using the calibration curve without reference to standards at the time of analysis.